Using Programmable SoC for Reliable Applications: Qualification
Methodologies, Fault Tolerance Techniques and Radiation Tests
All Programmable System-on-Chip (APSoC) devices can offer high performance because of the combination between high speed embedded processors and the flexibility of the programmable logic. Thus, APSoC can be attractive for self-driving car, satellites, servers, European Organization for Nuclear Research (CERN) environment and many other applications that require reliability. However, APSoCs may be prone to experience Single Event Effects (SEE). In this tutorial, I will present a methodology to characterize the Processing System (PS) and the Programmable Logic (PL) under soft errors. Then, I will present a set of fault tolerance techniques that can be applied in the PS and in the PL parts for increasing the reliability. Furthermore, I will present radiation tests results for many applications running in a APSOC from Xilinx: Zynq.