Radiation, Interference and Soft Errors
Technology scaling, which made electronics accessible and affordable for almost everyone on the globe, has advanced IC and electronics since sixties. Nevertheless, it is well recognized that such scaling has introduced new (and major) reliability challenges to the semiconductor industry. This talk addresses the background mechanisms impacting reliability of very deep submicron (VDSM) integrated circuits (ICs). Issues like ionizing radiation (Total-Ionizing Dose: TID and Single-Event Effects: SEEs) and electromagnetic interference (EMI) are presented and their combined effects on the reliability of modern ICs is discussed. Reliability failure mechanisms for radiation, the way they are modeled and how they are impacting IC lifetime will be covered. Laboratory test setup and recent results from experimental measurements are described. Classic design solutions to counteract with TID, SEEs and EMI in VDSM ICs are introduced.