Fabian Vargas obtained his Ph.D. Degree in Microelectronics from the Institut National Polytechnique de Grenoble (INPG), France, in 1995. At present, he is Full Professor at the Catholic University (PUCRS) in Porto Alegre, Brazil. His main research domains involve the HW-SW co-design and test of system-on-chip (SoC) for critical applications, system-level design methodologies for radiation, accelerated aging and electromagnetic interference (EMI), and embedded sensor design for characterization, reliability and aging binning. Among several activities, Prof. Vargas has served as Technical Committee Member or Guest-Editor in many IEEE-sponsored conferences and journals. He holds 6 Brazilian and international patents, co-authored a book and published over 200 refereed papers. Prof. Vargas is “Level-1” Researcher of the Brazilian National Science Foundation (CNPq) since 1996. He co-founded the IEEE-Computer Society Latin American Test Technology Technical Council (LA-TTTC) in 1997, the IEEE Latin American Test Symposium - LATS (former Latin American Test Workshop - LATW) in 2000 and the Biannual European - Latin American Summer School on Design, Test and Reliability (BELAS) in 2013. Prof. Vargas received for several times the Meritorious Service Award of the IEEE Computer Society for providing significant services as chair of the IEEE Latin American Regional TTTC Group and the LATS. Prof. Vargas is Senior Member and Golden Core Member of the IEEE Computer Society.