Combining Structural and Functional Test for Safety-Critical
This tutorial will introduce the key goals, the current solutions and best practices, the future challenges for designing and testing electronic devices used in safety-critical systems, with special emphasis on automotive devices. Specialized techniques and industrial standards of testing complex systems (which may correspond to a System on Chip, board or interconnected system) are introduced. The reuse for system test of design for test structures and test data developed at module level is discussed, including the limitations and research challenges. Structural test methods have to be complemented by functional test methods; hence, state-of-the-art and leading edge research for functional testing are covered. Solutions change depending on the scenario (manufacturing test or in field test) and the goal (test or diagnosis). Test cases are described and discussed.